| Time |
Theme |
Speaker |
| *Nov. 22* |
|
|
| 09:00-16:00 |
Check-in at Shanghai Lujiazui Century Hotel to receive tags and documents |
|
| *Nov. 23* |
|
|
| 08:30-09:00 |
Collect name cards or questionnaires in preparation for the lucky draw in the afternoon |
|
| 09:00-09:10 |
Opening ceremony address |
Wang Bohua,
Leading official from Ministry of Information Industry
|
| 09:10-09:40 |
Development of Electronic Testing and Measurement Technology during 11th Five-year Program |
Mr. Zhang Zhonghua, academician of Chinese Academy of Engineering, research fellow of China Metrology Research Institute |
| 09:40-10:20 |
Test Challenge for Convergence of Cellular and Other Wireless Technology. |
Mr. Li Feng, senior application engineer, Agilent Technologies Inc., US |
| 10:20-11:00 |
WiMax RF Test Solution |
Mr. Huang Yi, product engineer, ROHDE & SCHWARZ (China) Co., Ltd. |
| 11:00-11:40 |
New Measurement Challenge of Next Generation Component Test |
Keithley Instruments, Inc.Kevin Zhengyu Wang
|
| 11:40-12:10 |
YOKOGAWA HIGH PERFORMANCE & CONVENIENT TECHNOLOGY FOR ELECTRONIC PARTS |
Dr. JIANGYONG ZHONG, YOKOGAWA, Japan |
| 12:10-12:30 |
Research on Applications Related to Spectrum Analysis and Measurement Technology |
Mr. Chen Zunde, Good Will Instrument Co., LTD. (Taiwan) |
| 12:30-13:30 |
Lunch |
|
| 13:30-14:15 |
Efficient and Modular Solutions for Consumer Electronics Testing |
Mr. Xiang Xiaofeng, sales manager for East China, National Instruments |
| 14:20-15:00 |
Application of PXI System in Different T&M Development Environment |
Mr. Liu Guo’an, product manager, Measurement Automation Product Division, Linghua Technology Group |
| 15:00-15:30 |
Research and Application of Diagnostic Technology |
Mr. Xi Quansheng, general manager of Beijing Aerospace Measure-Control Technology Co., Ltd., deputy chief of General Armament Department General Testing Technology Expert Group |
| 15:30-16:00 |
The MCU Automatic Test System Based on RS-232 Serial Bus Network |
Mr. Chen Buyue, Senior Engineer With Missile Technology and Service Institute of Air Force Equipment Academy |
| 16:00-16:30 |
Boundary Scan Testing Technology |
Mr. Lei Jia, Guilin Electronic Industrial Institute |
| 16:30-17:00 |
Lucky draw with prizes ending activities of the 1st day |
|
| *Nov. 24* |
Special session for electronic testing and quality assurance |
|
| 09:00-09:40 |
How to Achieve RoHS Compliance |
Mr. Luo Daojun, Senior Engineer, Vice Director, Workgroup for Drafting National Standard of RoHS Testing Methods
|
| 09:45-10:25 |
IECQ Hazardous Substance Process Management |
Dr. Chen Qingji n, Lead Assessor for Hazardous Material Process Management
|
| 10:30-11:10 |
Calibration for EMC Testing instruments |
Zhao Min, Director of EMC Direction , Calibration & Testing Center of China CEPREI Laboratories
|
| 11:15-11:55 |
Anti-electric Shock Methods and Safety Testing of Electronic/electric Equipment |
Mr. Zhou Xiaoping, Senior Engineer, Quality Director of Nanjing Changsheng Instrument Limited, Vice General Engineer Trustee of Nanjing Measurement Technology Network Association, Member of the Measurement Test Specialized Committee
|
| 12:00-12:30 |
Lucky draw ending activities of the 2nd day |
|
Introduction
Conference Program